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High Precision Stress Measurements in Semiconductor Structures by Raman Microscopy
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Authors and Corporations: | , , |
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Title: | High Precision Stress Measurements in Semiconductor Structures by Raman Microscopy |
Dissertation Note: | Dissertation, Technische Universität Dresden, 2009 |
Type of Resource: | E-Book Thesis |
Language: | English |
published: |
Online-Ausg..
2010
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Subjects: | |
Source: | Qucosa |